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Surfcom Tester

Surfcom Tester
Surfcom Tester
Price And Quantity
  • Piece/Pieces
  • 1
  • Piece/Pieces
  • 1,250000 INR
    Product Description
    The offered surface roughness tester is designed to determine the surface texture of metallic as well as non-metallic parts in Delhi. This tester features small and compact design that makes it ideal for transportable with ease. It is bestowed with artificial intelligence functions that automatically select measuring range, an ideal cut off value and other parameters. Besides, this tester has user-friendly interface and supports different kinds of styli options.

    SURFCOM 130 A MAKE: ZEISS

    • Excellent performance during production
    • Unmatched straightness accuracy of 0.3um/50 mm

    SALIENT FEATURES:

    • Ease in changing Stlii
    • Different range of stylii options
    • Traverse length of 50 mm with in-built datum plane and large measuring range detector
    • Selectable Amplifier with LCD touch panel
    • Handy and compact for ease in usability
    • Globally required analysis parameters
    • Automates measurement due to artificial Intelligence functions that automatically select an ideal cut off value, measuring range and other allied conditions
    • Host of Analysis Functions- Entails 34 and 32 types of roughness and waviness parameters respectively
    • Tilt Correction Function: Provided with six types of automatic tilt correction
    • Evaluation Range Setting- Easy to set the required range and parameters of calculation with the aid of waveform over the screen that is enclosed by two cursors
    • PC Card Slot- Transfer and management of measuring conditions, measured data and result to personal computers in binary as well as text formats

    KEY SPECIFICATIONS:

    Measuring Range- X Axis- 50mm,

    Z axis - 800µ mm (Measuring range resolution: 800µ mm/10nm, 80µmm/1nm, 8 µ mm/0.1nm

    Straightness accuracy- 0.3µm/50mm

    Analysis items:

    Standards: Complies with JIS-2001, JIS-1994, JIS-19822, ISO- 1997, ISO-1984, DIN-1990, ASME-1995, CNOMO.

    Parameters : Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z, Sm, S, R Δa, R Δq, R λa, R λq, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R δc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR

    Evaluation curves: Section profile curve, foltered center line waviness curve, filtered waviness curve, rolling circle waviness curve, envelope waviness curve, DIN4776 special curve, rolling circle center line waveness curve, roughness motif curve.

    Surface Characteristics graphs: Bearing area, amplitude distribution (ADF) curve, power graph and curve.

    TILT Correction: Linear correction, latter half correction, first half correction, spline curve correction and both end correction.

    Magnification: Vertical (Z-axis) - 50-100K Auto, Horizontal (X-axis): 1-5K autos

    Detector: Tip radius 2µm, material 

    Special functions: Step analysis, Artificial Intelligence functions, PC card

    Standard Accessories: Recording Paper, Standard specimen, Touch Pen and Instruction Manual

    Trade Information
    • 10 Per Week
    • 3 Days
    • North India
    Contact Us

    Head Office: No. 10, First Floor, Alishan Complex, Kirti Nagar, New Delhi, Delhi, 110015, India
    Phone :91-11-45072990